On efficiently and reliably achieving low defective part levels

How can we guarantee that a testing method will stably and efficiently achieve a very low defective part level? Traditional testing methods rely upon faults to model all defects. As technology advances, this approach becomes increasingly questionable. If only a subset of defects are modeled as faults, then as fault coverage approaches 100%, the tests mill be more and more biased in favor of fault detection. Unfortunately, this reduces the testing efficiency for defects and limits the quality level that we can achieve. In this paper, we propose models for the testing process and suggest a solution which we call “unbiased test generation”. We define two types of testing bias, and these new metrics can be used to compare and evaluate test generation methods in practice