Title :
Session Circuit design and testing
Abstract :
Start of the above-titled section of the conference proceedings record.
Keywords :
Circuit synthesis; Circuit testing;
Conference_Titel :
Microelectronics, 2008. MIEL 2008. 26th International Conference on
Conference_Location :
Nis
Print_ISBN :
978-1-4244-1881-7
DOI :
10.1109/ICMEL.2008.4559300
