• DocumentCode
    2059645
  • Title

    Analysis and Modeling of Crosstalk Noise in Domino CMOS Circuits

  • Author

    Sharma, Vipin ; Al-Assadi, Waleed K.

  • Author_Institution
    Univ. of Missouri, Rolla
  • fYear
    2007
  • fDate
    20-22 April 2007
  • Firstpage
    374
  • Lastpage
    381
  • Abstract
    Domino CMOS logics offer designers with the advantage of most influential circuit design parameters viz., speed, higher integration density and lower power dissipation. This has made a common practice to use the domino CMOS in high performance integrated circuits. However, along with these positives comes inherently low crosstalk noise immunity. This reduced noise immunity of domino CMOS logics is continuously aggravating as recent trends in integrated circuit technology are constantly followed. Although several works investigate the problem of crosstalk noise at the inputs of domino circuits, crosstalk at the dynamic node of the domino circuits has been ignored. In this paper, we propose a model for crosstalk noise at the dynamic node of domino CMOS logic circuits. The model developed incorporates a newly derived switching threshold for the output static inverter in domino CMOS logics to more accurately predict the crosstalk noise immunity of the design. Application of this model can ensure immunity of domino circuits from crosstalk failures.
  • Keywords
    BiCMOS logic circuits; crosstalk; crosstalk noise; domino CMOS logic circuits; static inverter; switching threshold; CMOS integrated circuits; CMOS logic circuits; Circuit synthesis; Crosstalk; Integrated circuit noise; Integrated circuit technology; Logic design; Noise reduction; Power dissipation; Semiconductor device modeling; Capacitive coupling; crosstalk; domino logic circuits;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Region 5 Technical Conference, 2007 IEEE
  • Conference_Location
    Fayetteville, AR
  • Print_ISBN
    978-1-4244-1280-8
  • Electronic_ISBN
    978-1-4244-1280-8
  • Type

    conf

  • DOI
    10.1109/TPSD.2007.4380338
  • Filename
    4380338