DocumentCode
2059726
Title
A method for the lifetime prediction of MOV
Author
Wen Yuanfang ; Yan Xianglian ; Liu Chun
Author_Institution
Dept. of Electr. & Electron. Eng., Huazhong Univ. of Sci. & Tech, Wuhan
fYear
2001
fDate
2001
Firstpage
757
Lastpage
760
Abstract
On the basis of a number of the multi-stress aging experimental analysis, by means of the characteristic points of the resistive leakage current-time curves and by using the similarity condition, a method for the lifetime prediction of MOV is presented in this paper. The life prediction of MOV made in China has shown that the method is reliable and worthwhile
Keywords
ageing; leakage currents; life testing; varistors; China; lifetime prediction; metal oxide varistors; multi-stress aging; resistive leakage current-time curves; similarity condition; Aging; Energy management; Engineering management; IEC standards; Leakage current; Power engineering and energy; Protection; Temperature; Testing; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Insulating Materials, 2001. (ISEIM 2001). Proceedings of 2001 International Symposium on
Conference_Location
Himeji
Print_ISBN
4-88686-053-2
Type
conf
DOI
10.1109/ISEIM.2001.973788
Filename
973788
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