DocumentCode
2059732
Title
Synthesis and retiming for the pseudo-exhaustive BIST of synchronous sequential circuits
Author
Lejmi, Samir ; Kaminska, Bozena ; Ayari, Bechir
Author_Institution
Ecole Polytech. de Montreal, Que., Canada
fYear
1995
fDate
21-25 Oct 1995
Firstpage
683
Lastpage
692
Abstract
In this work, we present a new approach for the pseudo-exhaustive BIST of synchronous sequential circuits. We first give a characterization of the flip-flops that cause the unbalanced structure of the acyclic circuit using peripheral retiming techniques, and, consequently, both logic optimization and balancing problem are considered and solved in the same phase. Second, the balancing solution is considered as a first step of the partitioning problem. For the remaining balanced circuit, the segmentation edges are selected such that there is a retiming minimizing the number of segmentation cells in the retimed circuit. Experimental results show that our approach significantly reduces the hardware overhead relative to the existing approaches
Keywords
automatic testing; boundary scan testing; built-in self test; fault diagnosis; flip-flops; logic partitioning; logic testing; minimisation of switching nets; sequential circuits; timing; acyclic circuit; balancing problem; flip-flops; hardware overhead reduction; logic optimization; number of segmentation cells; partitioning problem; peripheral retiming techniques; pseudo-exhaustive BIST; segmentation edges; synchronous sequential circuits; synthesis; unbalanced structure; Built-in self-test; Circuit synthesis; Circuit testing; Combinational circuits; Delay; Flip-flops; Hardware; Logic; Sequential analysis; Sequential circuits;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1995. Proceedings., International
Conference_Location
Washington, DC
ISSN
1089-3539
Print_ISBN
0-7803-2992-9
Type
conf
DOI
10.1109/TEST.1995.529898
Filename
529898
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