• DocumentCode
    2059815
  • Title

    Formal verification of the UltraSPARC(TM) family of techniques

  • Author

    Levitt, Marc E.

  • Author_Institution
    Sun Microele., Mountain View, CA, USA
  • fYear
    1996
  • fDate
    20-25 Oct 1996
  • Firstpage
    849
  • Lastpage
    856
  • Abstract
    This paper describes a novel and important use of a commercial Automatic Test Pattern Generation (ATPG) tool to perform formal verification during the design of the UltraSPARC(TM)-I and UltraSPARC(TM)-II microprocessors. The verification problem addressed in this paper is that of required signal constraints amongst a group of signals to ensure correct multiplexor operation. We do not address the equivalence between two representations of a design which is the more common problem in literature. The technique developed was a significant contributor to the overall success of the project. The problem addressed, solution formulation, software developed, and results are presented
  • Keywords
    computer testing; design for testability; formal verification; integrated circuit testing; multiplexing; multiplexing equipment; ATPG; Automatic Test Pattern Generation; UltraSPARC; binary decision diagrams; design rules; equivalence; formal verification; microprocessors; multiplexed design; multiplexor operation; rule violations; signal constraints; Automatic test pattern generation; Decoding; Design automation; Formal verification; Libraries; Logic design; Microelectronics; Microprocessors; Signal design; Sun;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1996. Proceedings., International
  • Conference_Location
    Washington, DC
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-3541-4
  • Type

    conf

  • DOI
    10.1109/TEST.1996.557146
  • Filename
    557146