DocumentCode
2059824
Title
Controlled Self-formation of GaN Nanotubes by Inductively Coupled Plasmas Etching
Author
Hung, S.C. ; Su, Y.K. ; Chang, S.J. ; Liang, T.C.
Author_Institution
Inst. of Microelectron., Nat. Cheng Kung Univ., Tainan
fYear
2006
fDate
18-21 Jan. 2006
Firstpage
1392
Lastpage
1395
Abstract
In this work, we fabricated GaN hollow nanorods by using inductively coupled plasma (ICP) etching. We found that tops of these nanotubes were hexagonal with the c-axis perpendicular to substrate surface. We also found that density of the GaN nanorods were not strongly dependent on etching parameters, which suggests that the formation of these GaN nanotubes was related to the dislocation density in the original GaN epitaxial layers. Furthermore, it was found that we could reduce the dimension and increase the density of the GaN nanotubes by decreasing the Ar concentrations during ICP etching
Keywords
III-V semiconductors; dislocation density; gallium compounds; plasma materials processing; self-assembly; semiconductor growth; semiconductor nanotubes; sputter etching; GaN; ICP etching; controlled self-formation; dislocation density; epitaxial layers; gallium nitride nanotubes; hollow nanorods; inductively coupled plasma etching; Conducting materials; Epitaxial layers; Gallium nitride; Lithography; Nanotubes; Nuclear and plasma sciences; Optical materials; Plasma applications; Sputter etching; Thermal conductivity; FESEM; GaN; HRSEM; ICP; RIE; nanotubes;
fLanguage
English
Publisher
ieee
Conference_Titel
Nano/Micro Engineered and Molecular Systems, 2006. NEMS '06. 1st IEEE International Conference on
Conference_Location
Zhuhai
Print_ISBN
1-4244-0139-9
Electronic_ISBN
1-4244-0140-2
Type
conf
DOI
10.1109/NEMS.2006.334773
Filename
4135203
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