• DocumentCode
    2059824
  • Title

    Controlled Self-formation of GaN Nanotubes by Inductively Coupled Plasmas Etching

  • Author

    Hung, S.C. ; Su, Y.K. ; Chang, S.J. ; Liang, T.C.

  • Author_Institution
    Inst. of Microelectron., Nat. Cheng Kung Univ., Tainan
  • fYear
    2006
  • fDate
    18-21 Jan. 2006
  • Firstpage
    1392
  • Lastpage
    1395
  • Abstract
    In this work, we fabricated GaN hollow nanorods by using inductively coupled plasma (ICP) etching. We found that tops of these nanotubes were hexagonal with the c-axis perpendicular to substrate surface. We also found that density of the GaN nanorods were not strongly dependent on etching parameters, which suggests that the formation of these GaN nanotubes was related to the dislocation density in the original GaN epitaxial layers. Furthermore, it was found that we could reduce the dimension and increase the density of the GaN nanotubes by decreasing the Ar concentrations during ICP etching
  • Keywords
    III-V semiconductors; dislocation density; gallium compounds; plasma materials processing; self-assembly; semiconductor growth; semiconductor nanotubes; sputter etching; GaN; ICP etching; controlled self-formation; dislocation density; epitaxial layers; gallium nitride nanotubes; hollow nanorods; inductively coupled plasma etching; Conducting materials; Epitaxial layers; Gallium nitride; Lithography; Nanotubes; Nuclear and plasma sciences; Optical materials; Plasma applications; Sputter etching; Thermal conductivity; FESEM; GaN; HRSEM; ICP; RIE; nanotubes;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nano/Micro Engineered and Molecular Systems, 2006. NEMS '06. 1st IEEE International Conference on
  • Conference_Location
    Zhuhai
  • Print_ISBN
    1-4244-0139-9
  • Electronic_ISBN
    1-4244-0140-2
  • Type

    conf

  • DOI
    10.1109/NEMS.2006.334773
  • Filename
    4135203