Title :
Synthetic parameters for handwriting classification
Author :
Bouletreau, V. ; Vincent, N. ; Sabourin, R. ; Emptoz, H.
Author_Institution :
Lab. RFV, Inst. Nat. des Sci. Appliquees, Villeurbanne, France
Abstract :
In this paper, we present a new family of parameters for handwriting analysis based on the fractal behavior of writing. These parameter allow the classification of writing into different families which could be used as a preliminary step for recognition methods. They also constitute a way to quantify some legibility properties, and we show that they can be useful for cognitive approaches to handwriting analysis
Keywords :
cognitive systems; fractals; handwriting recognition; pattern classification; cognitive approaches; fractal behavior; handwriting analysis; handwriting classification; legibility properties; recognition methods; synthetic parameters; writing; Fractals; Geometry; Handwriting recognition; Humans; Learning systems; Linearity; Pattern recognition; Qualifications; Shape; Writing;
Conference_Titel :
Document Analysis and Recognition, 1997., Proceedings of the Fourth International Conference on
Conference_Location :
Ulm
Print_ISBN :
0-8186-7898-4
DOI :
10.1109/ICDAR.1997.619822
