DocumentCode :
2059868
Title :
Cubic InGaN/GaN multiple quantum wells and AlGaN/GaN Bragg reflectors for green resonant cavity LED
Author :
Li, Shunfeng ; Schromann, J. ; Pawlis, Alexander ; As, Donat J. ; Lischa, K.
Author_Institution :
Dept. of Phys., Paderborn Univ., Germany
fYear :
2004
fDate :
20-25 Sept. 2004
Firstpage :
61
Lastpage :
64
Abstract :
High quality cubic InGaN/GaN multi-quantum wells (MQWs) were grown with clearly resolved superlattice peaks in high resolution X-ray diffraction. We show that during a growth interruption between InGaN well and GaN barrier growth, In atoms segregated at the InGaN surface can evaporate. This procedure results in room temperature photoluminescence (PL) emission with full width at half maximum (FWHM) of 240 meV. Distributed c-AlGaN/GaN Bragg reflectors (DBR) which consist of 15 layer stacks have a maximum reflectivity of about 50% at 514 nm and a stop band width of 33 nm. Enhanced 526 nm room temperature PL emission has been observed from a λ cavity with c-InGaN/GaN MQWs active layer grown on 12 stacks backside AlGaN/GaN DBR.
Keywords :
III-V semiconductors; X-ray diffraction; aluminium compounds; cavity resonators; distributed Bragg reflectors; gallium compounds; indium compounds; light emitting diodes; photoluminescence; reflectivity; semiconductor growth; semiconductor quantum wells; semiconductor superlattices; surface segregation; wide band gap semiconductors; 293 to 298 K; AlGaN-GaN; AlGaN/GaN Bragg reflectors; InGaN-GaN; barrier growth; cubic InGaN/GaN multiple quantum well; green resonant cavity LED; high resolution X-ray diffraction; reflectivity; room temperature photoluminescence; stop band width; superlattice; surface aggregation; Aluminum gallium nitride; Atomic layer deposition; Distributed Bragg reflectors; Gallium nitride; Light emitting diodes; Quantum well devices; Resonance; Superlattices; Temperature; X-ray diffraction;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconducting and Insulating Materials, 2004. SIMC-XIII-2004. 13th International Conference on
Print_ISBN :
0-7803-8668-X
Type :
conf
DOI :
10.1109/SIM.2005.1511386
Filename :
1511386
Link To Document :
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