DocumentCode :
2059926
Title :
Tuning Semiconducting Properties of Single Carbon Nanotube for Fabrication of Nano Devices
Author :
Chan, Ho-Yin ; Xi, Ning ; Zhang, Jiangbo ; Li, Guangyong
Author_Institution :
Robotics & Autom. Lab., Michigan State Univ., East Lansing, MI
fYear :
2006
fDate :
18-21 Jan. 2006
Firstpage :
1410
Lastpage :
1413
Abstract :
Carbon nanotube (CNT) is found to be an amazing material for nanoelectronics due to its unique properties. It provides the possibility of miniaturizing the traditional electronic elements. Recently, people have been focusing on exploring its applications on optoelectronics because CNT is a direct bandgap material and its bandgap is inversely related to its diameter. Thus, it is ease for photon adsorption or generation with different wavelengths. In this paper, we presented the modification of the diameter of a single multi-walled carbon nanotube (s-MWNT) by electrical breakdown of nanotube walls. Thus, the conduction mechanism of the single carbon nanotube (s-CNT) can change from conducting to semi-conducting. Also, the barrier height of the s-CNT based diode which is fabricated by using atomic force microscopy based nanomanipulation system, can be indirectly modified, which has the same effect from CNT doping. The breakdown of a MWNT was investigated using atomic force microscopy (AFM) and the diameter, changed from 60 nm to ~10 nm, was measured at each step of breakdowns. Using this modification technique, the s-CNT based diode can potentially be used in optoelectronics
Keywords :
atomic force microscopy; carbon nanotubes; electric breakdown; elemental semiconductors; nanoelectronics; nanotube devices; optoelectronic devices; semiconductor diodes; C; CNT doping; atomic force microscopy; barrier height; electrical breakdown; nanodevices fabrication; nanoelectronics; nanomanipulation system; nanotube walls; optoelectronics; s-CNT based diode; semiconducting property; single multi-walled carbon nanotube; Atomic force microscopy; Atomic measurements; Carbon nanotubes; Electric breakdown; Force measurement; Optical device fabrication; Organic materials; Photonic band gap; Semiconductivity; Semiconductor diodes;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nano/Micro Engineered and Molecular Systems, 2006. NEMS '06. 1st IEEE International Conference on
Conference_Location :
Zhuhai
Print_ISBN :
1-4244-0139-9
Electronic_ISBN :
1-4244-0140-2
Type :
conf
DOI :
10.1109/NEMS.2006.334777
Filename :
4135207
Link To Document :
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