Title :
On the Analysis of Combined Synchronization Error Effects in OFDM Systems
Author :
Chin, Wen-Long ; Chen, Sau-Gee
Author_Institution :
Dept. of Electron. Eng. & Inst. of Electron., Nat. Chiao Tung Univ., Hsinchu
Abstract :
This work analyzes combined effects of major synchronization errors, including the symbol time offset (STO), carrier frequency offset (CFO) and sampling clock frequency offset (SCFO) of orthogonal frequency-division multiplexing (OFDM) systems. Such errors degrade the performance of an OFDM receiver by introducing inter-carrier interference (ICI) and inter-symbol interference (ISI) into the systems. Traditionally, designing an OFDM receiver needs plenty of Monte Carlo simulations because the synchronization errors are simultaneously inevitable in practical environments. Therefore, we formulate the theoretical signal-to-interference-and-noise ratio (SINR) to assist the design of OFDM receivers. By knowing the required SINR of specific application, all combinations of allowable errors can be derived. Then, cost-effective algorithms could be easily designed.
Keywords :
Monte Carlo methods; OFDM modulation; fading channels; intercarrier interference; intersymbol interference; synchronisation; Monte Carlo simulations; OFDM systems; carrier frequency offset; inter-carrier interference; inter-symbol interference; orthogonal frequency-division multiplexing systems; sampling clock frequency offset; symbol time offset; synchronization error effects; Algorithm design and analysis; Clocks; Degradation; Frequency division multiplexing; Frequency synchronization; Intersymbol interference; OFDM; Sampling methods; Signal design; Signal to noise ratio;
Conference_Titel :
Vehicular Technology Conference, 2009. VTC Spring 2009. IEEE 69th
Conference_Location :
Barcelona
Print_ISBN :
978-1-4244-2517-4
Electronic_ISBN :
1550-2252
DOI :
10.1109/VETECS.2009.5073724