DocumentCode :
2060007
Title :
Report on a pilot project successfully implementing a design-to-test methodology
Author :
Bullock, Scot
Author_Institution :
Teradyne Inc., Boston, MA, USA
fYear :
1995
fDate :
21-25 Oct 1995
Firstpage :
771
Lastpage :
780
Abstract :
Concurrent development of new device designs and test packages is recognized as essential to bringing new products to market faster This paper describes a series of software tools which, when used in concert, make implementation of this methodology feasible. The paper also reports on a pilot project that successfully used this implementation on a new device design and test package. An analysis of the results and lessons learned follows
Keywords :
design for testability; integrated circuit design; integrated circuit testing; product development; software packages; concurrent development; design-to-test methodology; device test; new products; pilot project; software tools; test packages; Debugging; Design engineering; Design methodology; Discrete event simulation; Instruments; Integrated circuit testing; Packaging; Performance evaluation; Software testing; Software tools;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 1995. Proceedings., International
Conference_Location :
Washington, DC
ISSN :
1089-3539
Print_ISBN :
0-7803-2992-9
Type :
conf
DOI :
10.1109/TEST.1995.529908
Filename :
529908
Link To Document :
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