Title :
A secure data transmission scheme for 1149.1 backplane test bus
Author :
Ke, Wuudiann ; Le, Duy ; Jarwala, Najmi
Author_Institution :
Eng. Res. Centre, AT&T Bell Labs., Princeton, NJ, USA
Abstract :
The four (five) wires defined in IEEE Std 1149.1 can be extended to the backplane to form a test bus that provides a linkage between 1149.1 boards and the backplane environment. This test architecture has many advantages. However, one of the disadvantages is its inability to detect errors that may occur during backplane data transmission and to protect the boards-under-test from unsafe corrupted data. In this paper, we propose a novel scheme to address these issues. The concept is first described, then followed by implementation examples. As a result of its simplicity and flexibility, the proposed scheme can be implemented in different ways to suit specific application needs
Keywords :
IEEE standards; automatic testing; boundary scan testing; data communication; printed circuit testing; system buses; 1149.1 backplane test bus; backplane environment; boards-under-test; corrupted data; secure data transmission scheme; test architecture; Application specific processors; Backplanes; Bridges; Communication system control; Control systems; Data communication; Master-slave; Protocols; System testing; Wires;
Conference_Titel :
Test Conference, 1995. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-2992-9
DOI :
10.1109/TEST.1995.529910