• DocumentCode
    2060057
  • Title

    Self-aligned n-shaped source/drain ultra-thin SOI MOSFETs

  • Author

    Eng, Yi-Chuen ; Lin, Jyi-Tsong ; Lin, Po-Hsieh ; Huang, Hau-Yuan ; Kang, Shiang-Shi ; Kao, Kung-Kai ; Lin, Jeng-Da ; Tseng, Yi-Ming ; Tsai, Ying-Chieh

  • Author_Institution
    Dept. of Electr. Eng., Nat. Sun Yat-Sen Univ. (NSYSU EE), Kaohsiung
  • fYear
    2008
  • fDate
    11-14 May 2008
  • Firstpage
    485
  • Lastpage
    488
  • Abstract
    What is silicon-on-insulator (SOI)? Why SOI? Because of the excellent short-channel effects (SCEs) immunity, SOI group is generally considered to be a very strong candidate in the end of the CMOS (complementary metal-oxide semiconductor) scaling, as compared to bulk silicon. This paper aims to propose a novel device architecture namely self-aligned (SA) Pi-shaped source/drain ultra-thin SOI MOS field-effect transistor (Pi-S/D UTSOI MOSFET). Although this approach is based on simulation, numerical simulations, it demonstrates the trends of electrical characteristics in the proposed structure. This work also illustrates the process simulation and the tradeoff between the self-heating and the short-channel behaviors which are two important attributes of the future scaled-down UTSOI devices.
  • Keywords
    MOSFET; semiconductor device models; silicon-on-insulator; thin film transistors; CMOS; MOSFET; Si; complementary metal-oxide semiconductor; field-effect transistor; self-heating; short-channel behaviors; short-channel effects; silicon-on-insulator; source-drain ultra-thin SOI MOS field-effect transistor; Chemical vapor deposition; Electric variables; Etching; FETs; Lattices; MOS devices; MOSFETs; Numerical simulation; Silicon on insulator technology; Thermal degradation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microelectronics, 2008. MIEL 2008. 26th International Conference on
  • Conference_Location
    Nis
  • Print_ISBN
    978-1-4244-1881-7
  • Electronic_ISBN
    978-1-4244-1882-4
  • Type

    conf

  • DOI
    10.1109/ICMEL.2008.4559327
  • Filename
    4559327