Title :
PowerPC(TM) array verification methodology using formal techniques
Author :
Ganguly, Neeta ; Abadir, Magdy ; Pandey, Manish
Author_Institution :
Motorola Inc., Austin, TX, USA
Abstract :
In this paper we discuss the methodology used on PowerPC RISC microprocessors to verify the correctness of embedded array blocks. The functional behavior of these blocks cannot be verified using traditional functional simulators since the search space is too large. Our methodology combines the use of equivalence checking formal methods, simulation using ATPG test vectors, and symbolic trajectory evaluation We discuss how these techniques are applied to verify the operation of an array in during design representation formats. We also discuss how these techniques can be used for checking the consistency of different design representations
Keywords :
automatic testing; computer testing; design for testability; integrated circuit testing; logic arrays; logic testing; real-time systems; reduced instruction set computing; ATPG test vectors; PowerPC RISC microprocessors; array verification methodology; embedded array blocks; equivalence checking; formal techniques; functional behavior; functional simulators; symbolic trajectory; Automatic test pattern generation; Design methodology; Formal verification; Logic arrays; Microprocessors; Power generation; Reduced instruction set computing; Testing; Timing; Trademarks;
Conference_Titel :
Test Conference, 1996. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-3541-4
DOI :
10.1109/TEST.1996.557147