An open system to interface IEEE-488 measurement devices designed in a microelectronics environment

Author

Perelló, C. ; Poch, N. ; Schroeter, C. ; Millán, J.

Author_Institution

Centro Nacional de Microelectron., Univ. Autonoma de Barcelona, Spain

Volume

1

fYear

1996

fDate

1996

Firstpage

192

Abstract

The high production level in microelectronics, leads to the need of using automated data acquisition and data analysis methods. Since often highly specialized measurement devices are used, a method is presented in this report, to build a high-level interface between the user and the measurement devices. This report proposes to use the capabilities of modern computer systems to enable parallel and remote access to measuring devices via a networked host without having to use a dedicated unit to perform this task. An approach is described on the basis of typical PC-compatible computer running the Linux OS and “Open Implementation” software

Keywords

application program interfaces; automatic test equipment; automatic test software; computer interfaces; data acquisition; device drivers; open systems; peripheral interfaces; production testing; GPIB; IEEE-488 measurement devices; Linux OS; PC-compatible computer; application interface; application program; automated data acquisition; automated microelectronics characterisation; device driver interface; high-level interface; open implementation software; open system; parallel access; remote access; virtual instrument; Computer networks; Concurrent computing; Data acquisition; Data analysis; Linux; Microelectronics; Open systems; Operating systems; Performance evaluation; Production;

fLanguage

English

Publisher

ieee

Conference_Titel

Instrumentation and Measurement Technology Conference, 1996. IMTC-96. Conference Proceedings. Quality Measurements: The Indispensable Bridge between Theory and Reality., IEEE

Conference_Location

Brussels

Print_ISBN

0-7803-3312-8

Type

conf

DOI

10.1109/IMTC.1996.507373

Filename

507373