Title :
Measurements of electrical conductivity of a nanometer-scale water meniscus by atomic force microscopy
Author :
Martín, Cristina ; Murano, Francesc Pérez ; Dagata, John A.
Author_Institution :
Centre Nacional de Microelectron., CSIC, Bellaterra, Spain
Abstract :
A technique to acquire electrical current with Atomic Force Microscopy (AFM) is presented. It consists on the simultaneous acquisition of force versus distance and current versus distance curves. The measurements allow to analyze the time evolution of current during AFM nano-oxidation and to study the electrical conductivity of the water meniscus.
Keywords :
atomic force microscopy; electric current measurement; electrical conductivity; nanotechnology; oxidation; water; AFM nanooxidation; H2O; atomic force microscopy; current-distance curve; electrical conductivity; electrical current; force-distance curve; nanometer scale water meniscus; time evolution; Atomic force microscopy; Atomic measurements; Conductivity measurement; Current measurement; Electric variables measurement; Force measurement; Geometry; Oxidation; Surface topography; Voltage;
Conference_Titel :
Nanotechnology, 2003. IEEE-NANO 2003. 2003 Third IEEE Conference on
Print_ISBN :
0-7803-7976-4
DOI :
10.1109/NANO.2003.1231030
