DocumentCode :
2060248
Title :
RFIC Design Methodology: Functional Verification
Author :
Dunham, William
Author_Institution :
Cadence Design Syst., Inc., San Jose
fYear :
2007
fDate :
20-22 April 2007
Firstpage :
113
Lastpage :
116
Abstract :
Full-chip functional verification for RF-A/MS (analog mixed-signal) applications is not only new as a "design methodology process" to some design organizations; but, is fast becoming a "must have" verification as a final tape-out simulation sign-off. Today\´s wireless industry, due to tight schedule demands and short product life-cycles, requires that a RFIC development group deliver "1st pass functional silicon." Then, when functional RFIC silicon is produced, minor design changes (minimal mask-layer changes) needed to meet performance specifications can be accommodated within a wireless product schedule.
Keywords :
radiofrequency integrated circuits; RFIC design methodology; Circuit synthesis; Design automation; Design methodology; Hardware design languages; Job shop scheduling; Process design; Radio frequency; Radiofrequency integrated circuits; Silicon; Solid modeling;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Region 5 Technical Conference, 2007 IEEE
Conference_Location :
Fayetteville, AR
Print_ISBN :
978-1-4244-1280-8
Electronic_ISBN :
978-1-4244-1280-8
Type :
conf
DOI :
10.1109/TPSD.2007.4380363
Filename :
4380363
Link To Document :
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