DocumentCode
2060272
Title
Effect of noncoherent islands on the optical properties of the 1.3 μm InAs/GaAs quantum dots during rapid thermal annealing
Author
Shi, G.X. ; Xu, B. ; Ye, X.L. ; Jin, P. ; Chen, Y.H. ; Wang, Y.L. ; Cui, C.X. ; Wang, Z.G.
Author_Institution
Key Lab. of Semicond. Mat. Sci., Chinese Acad. of Sci., Beijing, China
fYear
2004
fDate
20-25 Sept. 2004
Firstpage
135
Lastpage
138
Abstract
The effect of thermal annealing of InAs/GaAs quantum dots (QDs) with emission wavelength at 1.3 μm have been investigated by photoluminescence (PL) and transmission electron microscopy (TEM) measurements. There is a dramatic change in the PL spectra when the annealing temperature is raised up to 800°C: an accelerated blueshift of the main emission peak of QDs together with an inhomogeneous broadening of the linewidth. The TEM images shows that the lateral size of normal QDs decreases as the annealing temperature is increased, while the noncoherent islands increase their size and density. A small fraction of the relative large QDs contain dislocations when the annealing temperature increases up to 800 V. The latter leads to the strong decrease of the PL intensity.
Keywords
III-V semiconductors; dislocations; gallium arsenide; indium compounds; island structure; photoluminescence; rapid thermal annealing; semiconductor quantum dots; spectral line broadening; spectral line shift; transmission electron microscopy; 1.3 mum; 800 degC; InAs-GaAs; InAs/GaAs quantum dots; TEM; blueshift; dislocations; linewidth broadening; noncoherent islands; photoluminescence; rapid thermal annealing; transmission electron microscopy; Electron emission; Electron optics; Gallium arsenide; Photoluminescence; Quantum dots; Rapid thermal annealing; Stimulated emission; Temperature; Transmission electron microscopy; Wavelength measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconducting and Insulating Materials, 2004. SIMC-XIII-2004. 13th International Conference on
Print_ISBN
0-7803-8668-X
Type
conf
DOI
10.1109/SIM.2005.1511402
Filename
1511402
Link To Document