DocumentCode
2060574
Title
Analysis of mechanical and electrical straining effects on TFRs — statistical bimodal conductance approach
Author
Stanimirovic, Z. ; Jevtic, M.M. ; Stanimirovic, I.
Author_Institution
IRITEL A.D., Belgrade
fYear
2008
fDate
11-14 May 2008
Firstpage
575
Lastpage
577
Abstract
In this paper statistical approach to analysis of mechanically and electrically strained TFRs will be presented using parameters from deterministic model. Noise performances of stained resistors will be explained using redistribution of numbers of contacts and MIM cells as well as adequate contributions of noise due to metallic conduction and noise due to fluctuations in MIM cells to total noise of strained resistor.
Keywords
MIM devices; electrical conductivity; noise; statistical analysis; thick film resistors; MIM cells; electrical straining; mechanical straining; metallic conduction; noise; statistical bimodal conductance; thick-film resistors; Acoustical engineering; Contacts; Degradation; Electric resistance; Fluctuations; Glass; Microelectronics; Noise measurement; Performance evaluation; Resistors;
fLanguage
English
Publisher
ieee
Conference_Titel
Microelectronics, 2008. MIEL 2008. 26th International Conference on
Conference_Location
Nis
Print_ISBN
978-1-4244-1881-7
Electronic_ISBN
978-1-4244-1882-4
Type
conf
DOI
10.1109/ICMEL.2008.4559351
Filename
4559351
Link To Document