DocumentCode
2060576
Title
A monolithic, wide-temperature, charge amplification channel for extreme environments
Author
Diestelhorst, Ryan M. ; Finn, Steven ; Najafizadeh, Laleh ; Ma, Desheng ; Xi, Pengfei ; Ulaganathan, Chandradevi ; Cressler, John D. ; Blalock, Benjamin J. ; Dai, Foster ; Mantooth, Alan ; Del Castillo, Linda ; Mojarradi, Mohammad ; Berger, Richard
Author_Institution
Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
fYear
2010
fDate
6-13 March 2010
Firstpage
1
Lastpage
10
Abstract
This paper describes the design, implementation, and characterization of a monolithic charge amplification channel for use as a piezoelectric sensor front-end in extreme environment applications. 12The design leverages a 50 GHz peak-fT SiGe BiCMOS technology platform to achieve functionality across a wide-temperature range from -180°C to 120°C. As part of a much larger remote electronics unit, the channel is specified to amplify piezoelectric transducer signals with frequencies up to 5 kHz and amplitudes as low as 200 pC. Intended for use in lunar surface systems, the application requires the capability to absorb up to 100 krad(SiO2) of total ionizing dose (consistent with a typical lunar mission cycle) and be hardened against latch-up effects that cause system failure in a heavy ion radiation environment. Preliminary characterization of the channel shows the desired integration of an AC current input, programmable gain, and effective filtering at three distinct cutoff frequencies.
Keywords
BiCMOS integrated circuits; lunar surface; piezoelectric devices; AC current input; BiCMOS technology; SiGe; effective filtering; frequency 50 GHz; lunar surface systems; monolithic charge amplification channel; piezoelectric sensor; piezoelectric transducer signals; programmable gain; remote electronics unit; system failure; temperature -180 degC to 120 degC; wide-temperature channel; BiCMOS integrated circuits; Filtering; Frequency; Germanium silicon alloys; Ion radiation effects; Moon; Piezoelectric transducers; Radiation hardening; Sensor phenomena and characterization; Silicon germanium;
fLanguage
English
Publisher
ieee
Conference_Titel
Aerospace Conference, 2010 IEEE
Conference_Location
Big Sky, MT
ISSN
1095-323X
Print_ISBN
978-1-4244-3887-7
Electronic_ISBN
1095-323X
Type
conf
DOI
10.1109/AERO.2010.5446718
Filename
5446718
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