Title :
Testing a switching memory in a telecommunication system
Author :
Barbagallo, S. ; Corno, F. ; Prinetto, P. ; Reorda, M. Sonza
Author_Institution :
R&D Labs., Italtel Soc. Italiana Telecommun. SpA, Milan, Italy
Abstract :
The paper describes the approach followed for testing a real circuit produced by Italtel. Both on-line and off-line testing are considered and the performance and area overheads are taken into account to meet the constraints imposed by the circuit customers. BIST is adopted to test some embedded memories, and boundary scan is exploited to activate the test and gather the results. Particular care is taken to minimize the additional logic, by using the same circuitry for both on-line and off-line testing
Keywords :
automatic testing; boundary scan testing; built-in self test; fault diagnosis; inspection; integrated memory circuits; production testing; random-access storage; telecommunication equipment testing; BIST; Italtel; area overheads; boundary scan; command memory; embedded memories; inspection; logic; off-line testing; online testing; speech memory; switching memory; telecommunication system; test logic overhead; test protocol; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Delay; Hardware; Logic testing; Switching circuits; System testing; Telecommunication switching;
Conference_Titel :
Test Conference, 1995. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-2992-9
DOI :
10.1109/TEST.1995.529941
