DocumentCode :
2060811
Title :
An Improved Multiline model for Precise Estimation of Crosstalk
Author :
Sayil, Selahattin ; Rudrapati, Merlyn S. ; Borra, Uday K.
Author_Institution :
Lamar Univ., Beaumont
fYear :
2007
fDate :
20-22 April 2007
Firstpage :
239
Lastpage :
245
Abstract :
This work proposes a novel and accurate crosstalk noise estimation method in the presence of multiple RC lines for use in design automation tools. The proposed model, for the first time, presents a complete multiline noise model by representing active and passive aggressors simultaneously on the victim line. In the model, active aggressors are easily represented by current sources and passive aggressors are accurately modeled as equivalent capacitances. Each current source representing an active aggressor carries the same accuracy as the 2-pi representation. Equivalent capacitances for passive aggressors, on the other hand, consider resistive shielding effect and the realistic exponential aggressor waveform. This approach allows one to obtain a general noise model that considers the effect of many active and passive aggressors and general formulas derived can easily be applied to real cases. Noise peak and width expressions are derived and results are in good agreement with HSPICE results. Results show that average error for noise peak is 4.4% and for the width is 6.8% while allowing for very fast analysis.
Keywords :
RC circuits; SPICE; crosstalk; shielding; 2-pi representation; HSPICE results; RC lines; active aggressors; automation tools design; crosstalk noise estimation method; crosstalk precise estimation; current sources; equivalent capacitances; exponential aggressor waveform; general noise model; multiline model; multiline noise model; noise peak; passive aggressors; resistive shielding effect; victim line; Active noise reduction; CMOS technology; Capacitance; Circuit noise; Coupling circuits; Crosstalk; Delay effects; Electronic mail; Integrated circuit interconnections; Integrated circuit noise;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Region 5 Technical Conference, 2007 IEEE
Conference_Location :
Fayetteville, AR
Print_ISBN :
978-1-4244-1280-8
Electronic_ISBN :
978-1-4244-1280-8
Type :
conf
DOI :
10.1109/TPSD.2007.4380388
Filename :
4380388
Link To Document :
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