Automated 1.5 GHz SONET characterization

Author

Tepper, Rob ; Tarpo, Jim

Author_Institution

Appl. Micro Circuits Corp., San Diego, CA, USA

fYear

1995

fDate

21-25 Oct 1995

Firstpage

957

Lastpage

965

Abstract

While functional, D.C. parametric and limited at-speed testing of integrated circuits is typically done on commercially available test systems, these systems are not rated for SONET frequencies and do not lend themselves well to product characterization. This paper describes a test methodology and system designed specifically to address at-speed SONET characterization requirements

Keywords

SONET; application specific integrated circuits; automatic test equipment; automatic test software; automatic testing; data analysis; electronic engineering computing; integrated circuit testing; production testing; telecommunication equipment testing; 1.5 GHz; ASIC; ATE; D.C. parametric testing; SONET characterization; SONET frequencies; at-speed SONET characterization; limited at-speed testing; product characterization; test methodology; Bit error rate; Circuit testing; Clocks; Frequency; Integrated circuit technology; Integrated circuit testing; SONET; System testing; Throughput; Transmitters;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 1995. Proceedings., International

Conference_Location

Washington, DC

ISSN

1089-3539

Print_ISBN

0-7803-2992-9

Type

conf

DOI

10.1109/TEST.1995.529942

Filename

529942

Link To Document

https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2060818