DocumentCode
2060853
Title
Optimizing test strategies for SONET/SDH/ATM network element manufacturing
Author
Hoogerbrugge, Mark
Author_Institution
Queensferry Telecommun. Oper., Hewlett-Packard Ltd., South Queensferry, UK
fYear
1995
fDate
21-25 Oct 1995
Firstpage
973
Lastpage
978
Abstract
Time-to-market pressures dictate short test system development times for manufacturers of SONET, SDH and ATM equipment. This paper will evaluate the test process as part of the manufacturing process, and offer methodologies to optimize cost, throughput and product quality. This can be achieved by adopting the optimal test strategy and employing the right T&M instrumentation solutions
Keywords
SONET; economics; multiplexing; multiplexing equipment; optimisation; production testing; synchronous digital hierarchy; telecommunication equipment testing; SONET/SDH/ATM network; cost; functional board test; manufacturing test; optimal test strategy; process test; product quality; test system development times; throughput; Add-drop multiplexers; Asynchronous transfer mode; Costs; Manufacturing processes; Production; SONET; Switches; Synchronous digital hierarchy; System testing; Throughput;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1995. Proceedings., International
Conference_Location
Washington, DC
ISSN
1089-3539
Print_ISBN
0-7803-2992-9
Type
conf
DOI
10.1109/TEST.1995.529944
Filename
529944
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