Title :
Optimizing test strategies for SONET/SDH/ATM network element manufacturing
Author :
Hoogerbrugge, Mark
Author_Institution :
Queensferry Telecommun. Oper., Hewlett-Packard Ltd., South Queensferry, UK
Abstract :
Time-to-market pressures dictate short test system development times for manufacturers of SONET, SDH and ATM equipment. This paper will evaluate the test process as part of the manufacturing process, and offer methodologies to optimize cost, throughput and product quality. This can be achieved by adopting the optimal test strategy and employing the right T&M instrumentation solutions
Keywords :
SONET; economics; multiplexing; multiplexing equipment; optimisation; production testing; synchronous digital hierarchy; telecommunication equipment testing; SONET/SDH/ATM network; cost; functional board test; manufacturing test; optimal test strategy; process test; product quality; test system development times; throughput; Add-drop multiplexers; Asynchronous transfer mode; Costs; Manufacturing processes; Production; SONET; Switches; Synchronous digital hierarchy; System testing; Throughput;
Conference_Titel :
Test Conference, 1995. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-2992-9
DOI :
10.1109/TEST.1995.529944
