DocumentCode
2060963
Title
Automated optical detection of particles and defects on a Li-Ion-cell surface using a single-point analysis
Author
Lanza, Gisela ; Koelmel, Adrian ; Peters, Steven ; Sauer, Anna ; Stockey, Stefan
Author_Institution
Wbk - Inst. of Production Sci., Karlsruhe Inst. of Technol. (KIT), Karlsruhe, Germany
fYear
2013
fDate
17-20 Aug. 2013
Firstpage
675
Lastpage
680
Abstract
Electric mobility is of crucial importance for a sustainable future of individual mobility. Challenges in energy storage with batteries have been identified as a major barrier of a broader electrification of cars. Expensive raw materials, a high scrap rate in production of cells and the lack of a not fully automated process chain lead to high costs of electric cars. Within this paper a new approach, named Single-Point-Analysis, is presented to setup inline quality assurance in the production of cell foils using optical measurement techniques. The filtering algorithm observes the inter-point distance of each single point in the range of interest. Furthermore a mean distance for each single measurement point is calculated by considering the distances to its direct neighbors. The main focus is the detection of particles and defects like scratches on the cell surface. It is demonstrated that the developed analysis is able to clearly identify these typical failures of cells.
Keywords
automobiles; battery powered vehicles; quality assurance; raw materials; secondary cells; Li; automated optical detection; cars electrification; cell foils production; cell surface; cells production; electric cars; electric mobility; filtering algorithm; inter-point distance; lithium-ion cell surface; optical measurement techniques; particles detection; raw materials; setup inline quality assurance; single-point analysis; Atmospheric measurements; Batteries; Optical sensors; Optical variables measurement; Particle measurements; Production; Standards;
fLanguage
English
Publisher
ieee
Conference_Titel
Automation Science and Engineering (CASE), 2013 IEEE International Conference on
Conference_Location
Madison, WI
ISSN
2161-8070
Type
conf
DOI
10.1109/CoASE.2013.6653950
Filename
6653950
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