DocumentCode :
2061011
Title :
Lasing wavelength of GaAs single quantum well diodes with thin AlAs carrier blocking layers
Author :
Terashita, Y. ; Okazaki, M. ; Kamimura, K. ; Fujiwara, K.
Author_Institution :
Kyushu Inst. of Technol., Kitakyushu, Japan
fYear :
2004
fDate :
20-25 Sept. 2004
Firstpage :
263
Lastpage :
266
Abstract :
Lasing wavelength (λL) has been investigated of a set of high-quality GaAs graded-index separate-confinement-heterostructure single-quantum-well (Lz = 15 nm) laser diodes with and without 1 nm thick AlAs carrier blocking layers beside the well for temperatures between 20 and 300 K. Gain-guided 10 μm oxide stripe lasers with the AlAs layers show anomalous λL red-shifts with decreasing temperature, which do not follow the temperature dependence of the GaAs band-gap energy. We attribute these unusual λL red-shifts due to the quantum-confined Stark effect (QCSE) induced by accumulated charges because of the presence of the AlAs blocking layers for carrier tunneling injection. Absence of such λL red-shifts in the case of similar diodes without the AlAs layers indicate that the λL can be significantly influenced by Stark effect due to accumulated charges, confirming the importance of the QCSE for determination of the lasing wavelength.
Keywords :
III-V semiconductors; gallium arsenide; gradient index optics; quantum confined Stark effect; quantum well lasers; red shift; semiconductor thin films; 1 nm; 20 to 300 K; GaAs single quantum well diodes; GaAs-AlAs; carrier tunneling injection; gain-guided oxide stripe lasers; graded index; laser diodes; lasing wavelength; quantum-confined Stark effect; red shifts; separate confinement heterostructure; thin ALAS carrier blocking layers; Diode lasers; Gallium arsenide; Laser tuning; Quantum cascade lasers; Semiconductor device measurement; Stark effect; Temperature dependence; Threshold current; Tunneling; Wavelength division multiplexing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconducting and Insulating Materials, 2004. SIMC-XIII-2004. 13th International Conference on
Print_ISBN :
0-7803-8668-X
Type :
conf
DOI :
10.1109/SIM.2005.1511433
Filename :
1511433
Link To Document :
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