Title :
Two novel schemes for truncating finite element meshes
Author :
Jian Gong ; Volakis, J.L.
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Michigan Univ., Ann Arbor, MI, USA
Abstract :
In this paper, we investigate two mesh truncation schemes for finite element method (FEM) simulations. Specifically, we examine the performance of a new anisotropic perfectly matching layer and a numerical boundary condition (NBC) for truncating standard and printed guided structures. Results will be presented for modeling propagation in metallic waveguides and shielded microstrip lines.
Keywords :
electromagnetic wave propagation; electromagnetic wave reflection; mesh generation; microstrip lines; rectangular waveguides; waveguide theory; FEM simulations; anisotropic perfectly matching layer; finite element meshes; mesh truncation schemes; metallic waveguides; numerical boundary condition; performance; printed guided structures; propagation; rectangular waveguides; relection coefficient; shielded microstrip line; Anisotropic magnetoresistance; Computational modeling; Computer simulation; Finite element methods; Laboratories; OFDM modulation; Probes; Rectangular waveguides; Reflection; Tensile stress;
Conference_Titel :
Antennas and Propagation Society International Symposium, 1995. AP-S. Digest
Conference_Location :
Newport Beach, CA, USA
Print_ISBN :
0-7803-2719-5
DOI :
10.1109/APS.1995.529968
