DocumentCode

2061934

Title

ITC 1996 Lecture Series on Unpowered Opens Testing

Author

Parker, Kenneth P.

Author_Institution

Hewlett Packard Manufacturing Test Division PO Box 301, Loveland, CO 80539

fYear

1996

fDate

20-25 Oct 1996

Firstpage

924

Lastpage

924

Keywords

Circuit testing; Diodes; Engineering management; Inspection; Packaging; Pins; Printed circuits; Soldering; Technological innovation; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 1996. Proceedings., International

ISSN

1089-3539

Print_ISBN

0-7803-3541-4

Type

conf

DOI

10.1109/TEST.1996.557154

Filename

557154