Title :
ITC 1996 Lecture Series on Unpowered Opens Testing
Author :
Parker, Kenneth P.
Author_Institution :
Hewlett Packard Manufacturing Test Division PO Box 301, Loveland, CO 80539
Keywords :
Circuit testing; Diodes; Engineering management; Inspection; Packaging; Pins; Printed circuits; Soldering; Technological innovation; Voltage;
Conference_Titel :
Test Conference, 1996. Proceedings., International
Print_ISBN :
0-7803-3541-4
DOI :
10.1109/TEST.1996.557154
