Title :
Core level X-ray photoelectron spectroscopy of RbTiOPO4 and chemical bonding in KTiOPO4, crystal family
Author :
Makukha, Vladimir K. ; Atuchin, Viktor V. ; Kesler, Valeriy G.
Author_Institution :
Novosibirsk State Technical University, Novosibirsk, Russia, Institute of Semiconductor Physics, Siberian Branch, Russian Academy of Sciences, Uovosibfrsk, Russia
Abstract :
• XPS method enables to analyze parameters of chemical bonds in complex dielectric oxides. • Difference of energies of photoelectric yield from 0 1s level and cation level is the most reproducible parameter. • Ranges of electronic parameters have been found for core levels of KTiOPO4 crystals. • Relations of yield energy difference to mean chemical bond length L(M-O) are specific for different-type cations. • Electronic parameters of complex oxides can be predicted on the basis of their structural characteristics. • Diagrams ΔBE — L(M-O) can be applied to screening of invalid XPS measurements.
Conference_Titel :
Fundamental Problems of Micro/Nanosystems Technologies (MNST), 2010 IEEE 2nd Russia School and Seminar on
Conference_Location :
Novosibirsk, Russia
Print_ISBN :
978-1-4244-5962-9
Electronic_ISBN :
978-1-4244-5963-6
DOI :
10.1109/MNST.2010.5687143
