DocumentCode :
2062276
Title :
An efficient proximity probing algorithm for metrology
Author :
Panahi, Fatemeh ; Adler, Aviv ; van der Stappen, A. Frank ; Goldberg, K.
Author_Institution :
Dept. of Inf. & Comput. Sci., Utrecht Univ., Utrecht, Netherlands
fYear :
2013
fDate :
17-20 Aug. 2013
Firstpage :
342
Lastpage :
349
Abstract :
Metrology, the theoretical and practical study of measurement, has applications in automated manufacturing, inspection, robotics, surveying, and healthcare. An important problem within metrology is how to interactively use a measuring device, or probe, to determine some geometric property of an unknown object; this problem is known as geometric probing. In this paper, we study a type of proximity probe which, given a point, returns the distance to the boundary of the object in question. We consider the case where the object is a convex polygon P in the plane, and the goal of the algorithm is to minimize the upper bound on the number of measurements necessary to exactly determine P. We show an algorithm which has an upper bound of 3.5n + k + 2 measurements necessary, where n is the number of vertices and k ≤ 3 is the number of acute angles of P. Furthermore, we show that our algorithm requires O(1) computations per probe, and hence O(n) time to determine P.
Keywords :
measurement systems; probes; O(1) computations; convex polygon; metrology; proximity probing algorithm; upper bound; Clocks; Manufacturing; Metrology; Probes; Robots; Semiconductor device measurement; Upper bound;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Automation Science and Engineering (CASE), 2013 IEEE International Conference on
Conference_Location :
Madison, WI
ISSN :
2161-8070
Type :
conf
DOI :
10.1109/CoASE.2013.6653995
Filename :
6653995
Link To Document :
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