Title :
Optimization of preventive maintenance scheduling for semiconductor manufacturing systems: models and implementation
Author :
Yao, Xiaodong ; Fu, Michael ; Marcus, Steven I. ; Fernandez-Gaucherand, Emmanuel
Author_Institution :
Inst. for Syst. Res., Maryland Univ., College Park, MD, USA
Abstract :
Preventive maintenance (PM) is a vital activity in semiconductor manufacturing. A good PM schedule can increase the availability of tools by trading off between the planned unproductive down time versus the risk of much costlier unscheduled down time due to tool failures. Cluster tools are highly integrated systems made up of several processing modules (chambers) mechanically linked together, which can perform a sequence of semiconductor manufacturing processes. We present a two-layer hierarchical modeling framework for addressing the PM optimization problem for cluster tools, i.e., a Markov decision process (MDP) model at the higher level, and a mixed linear programming (LP) model at the lower level. Production planning data such as WIP levels are incorporated in these models. The LP model is solved using optimization packages EasyModeler and OSL. A case study comparing the results with a reference schedule is conducted in the simulation environment AutoSched AP, and numerical results are reported
Keywords :
Markov processes; decision theory; integrated circuit manufacture; linear programming; maintenance engineering; production control; scheduling; AutoSched AP; EasyModeler; Markov decision process; OSL; WIP levels; availability; cluster tools; mixed linear programming model; optimization problem; preventive maintenance scheduling; production planning; semiconductor manufacturing systems; two-layer hierarchical modeling framework; Availability; Computer aided manufacturing; Job shop scheduling; Linear programming; Manufacturing systems; Optimal scheduling; Preventive maintenance; Processor scheduling; Production planning; Semiconductor device manufacture;
Conference_Titel :
Control Applications, 2001. (CCA '01). Proceedings of the 2001 IEEE International Conference on
Conference_Location :
Mexico City
Print_ISBN :
0-7803-6733-2
DOI :
10.1109/CCA.2001.973899