Title : 
Model-based validation of safety-critical embedded systems
         
        
            Author : 
Feiler, Peter H.
         
        
            Author_Institution : 
Software Eng. Inst., Carnegie Mellon Univ., Pittsburgh, PA, USA
         
        
        
        
        
        
            Abstract : 
Safety-critical systems have become increasingly software reliant and the current development process of ¿build, then integrate¿ has become unaffordable. This paper examines two major contributors to today´s exponential growth in cost: system-level faults that are not discovered until late in the development process; and multiple truths of analysis results when predicting system properties through model-based analysis and validating them against system implementations. We discuss the root causes of such system-level problems, and an architecture-centric model-based analysis approach of different operational quality aspects from an architecture model. A key technology is the SAE Architecture Analysis & Design Language (AADL) standard for embedded software-reliant system. It supports a single source approach to analysis of operational qualities such as responsiveness, safety-criticality, security, and reliability through model annotations. The paper concludes with a summary of an industrial case study that demonstrates the feasibility of this approach.
         
        
            Keywords : 
embedded systems; program verification; safety; safety-critical software; software architecture; systems analysis; AADL standard; SAE Architecture Analysis & Design Language; architecture centric model based analysis approach; development process; embedded software reliant system; safety critical embedded model based validation; single source approach; system level fault; system level problem; system properties prediction; Aircraft; Communication system software; Control systems; Costs; Embedded software; Embedded system; Fuels; Measurement units; Predictive models; Software performance;
         
        
        
        
            Conference_Titel : 
Aerospace Conference, 2010 IEEE
         
        
            Conference_Location : 
Big Sky, MT
         
        
        
            Print_ISBN : 
978-1-4244-3887-7
         
        
            Electronic_ISBN : 
1095-323X
         
        
        
            DOI : 
10.1109/AERO.2010.5446809