DocumentCode :
2062911
Title :
11.2 A 10.8ps-time-resolution 256×512 image sensor with 2-Tap true-CDS lock-in pixels for fluorescence lifetime imaging
Author :
Min-Woong Seo ; Kagawa, Keiichiro ; Yasutomi, Keita ; Takasawa, Taishi ; Kawata, Yoshimasa ; Teranishi, Nobukazu ; Li, Zhuo ; Halin, Izhal Abdul ; Kawahito, Shoji
Author_Institution :
Shizuoka Univ., Hamamatsu, Japan
fYear :
2015
fDate :
22-26 Feb. 2015
Firstpage :
1
Lastpage :
3
Abstract :
Fluorescence lifetime imaging microscopy (FLIM), which is a nondestructive and minimally invasive manner and can therefore be applied to living cells and tissues, is a great analysis tool in fundamental physics as well as in the life sciences. Charge-coupled devices (CCDs) [1] and single-photon avalanche diodes (SPADs) [2,3] are used for time-resolved lifetime measurement. In particular, SPAD-based time-resolved imagers have a high single-photon sensitivity and good noise robustness. However, they consist of a SPAD array with pixel circuitry, time-to-digital converters (TDCs), digital integrators to amplify signals, and readout circuitry. To implement the high photon-counting rate, a large number of TDCs and digital integrators are required. The spatial resolution of the SPAD-based time-resolved imagers is limited on this account. A recently reported time-resolved CMOS imager [4] using a draining-only modulation (DOM) technique has an attractive feature that a very simple pixel structure and 2-stage charge transfer without transfer gate (TG) can be simultaneously attained. However, it has a small aperture area, a comparatively low transfer speed, and multiple outputs are a challenge.
Keywords :
CCD image sensors; CMOS image sensors; avalanche diodes; charge exchange; fluorescence; image resolution; optical sensors; readout electronics; sensor arrays; time measurement; time-digital conversion; 2-stage charge transfer; 2-tap true-CDS lock-in pixel; CCD; DOM technique; FLIM; SPAD; TDC; TG; charge-coupled device; draining-only modulation technique; fluorescence lifetime imaging microscopy; image sensor; living cell; photon-counting rate; signal amplification; single-photon avalanche diode; single-photon sensitivity; time 10.8 ps; time-resolved CMOS imager; time-resolved imager; time-resolved lifetime measurement; time-to-digital converter; tissue; transfer gate; CMOS integrated circuits; Fluorescence; Image sensors; Logic gates; Modulation; Sensors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid- State Circuits Conference - (ISSCC), 2015 IEEE International
Conference_Location :
San Francisco, CA
Print_ISBN :
978-1-4799-6223-5
Type :
conf
DOI :
10.1109/ISSCC.2015.7062994
Filename :
7062994
Link To Document :
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