DocumentCode
2063170
Title
Attribute selection algorithm of data-based scheduling strategy for semiconductor manufacturing
Author
Fei Qiao ; Yumin Ma ; Xiang Gu
Author_Institution
Sch. of Electron. & Inf. Eng., Tongji Univ., Shanghai, China
fYear
2013
fDate
17-20 Aug. 2013
Firstpage
410
Lastpage
415
Abstract
In today´s digital and information-based manufacturing environment, data are basic elements for almost every production control and management activity. This paper focuses on production data processing based on attribute analysis. There are thousands of attributes in semiconductor manufacturing. However, some of them are irrelevant and/or redundant to some optimal production control and management issues. It is hard to decide which attributes should be considered as input references. Rational attribute selection may lead to an accurate scheduling strategy and finally exerts a positive impact on the performance of the whole production line. This is the motivation of this work. Its goal is to investigate which attributes play the key roles in the manufacturing scheduling according to a specific performance criterion. A genetic algorithm-based selection approach for feature production attributes is proposed. Its prediction accuracy is verified via a practical wafer production line.
Keywords
genetic algorithms; integrated circuit manufacture; manufacturing data processing; production control; scheduling; semiconductor industry; semiconductor technology; attribute analysis; attribute selection algorithm; data-based scheduling strategy; genetic algorithm-based selection approach; information-based manufacturing environment; input references; manufacturing scheduling; optimal production control; practical wafer production line; production control; production data processing; production management; rational attribute selection; semiconductor manufacturing; Biological cells; Genetic algorithms; Job shop scheduling; Manufacturing; Semiconductor device modeling; Training;
fLanguage
English
Publisher
ieee
Conference_Titel
Automation Science and Engineering (CASE), 2013 IEEE International Conference on
Conference_Location
Madison, WI
ISSN
2161-8070
Type
conf
DOI
10.1109/CoASE.2013.6654027
Filename
6654027
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