• DocumentCode
    2063170
  • Title

    Attribute selection algorithm of data-based scheduling strategy for semiconductor manufacturing

  • Author

    Fei Qiao ; Yumin Ma ; Xiang Gu

  • Author_Institution
    Sch. of Electron. & Inf. Eng., Tongji Univ., Shanghai, China
  • fYear
    2013
  • fDate
    17-20 Aug. 2013
  • Firstpage
    410
  • Lastpage
    415
  • Abstract
    In today´s digital and information-based manufacturing environment, data are basic elements for almost every production control and management activity. This paper focuses on production data processing based on attribute analysis. There are thousands of attributes in semiconductor manufacturing. However, some of them are irrelevant and/or redundant to some optimal production control and management issues. It is hard to decide which attributes should be considered as input references. Rational attribute selection may lead to an accurate scheduling strategy and finally exerts a positive impact on the performance of the whole production line. This is the motivation of this work. Its goal is to investigate which attributes play the key roles in the manufacturing scheduling according to a specific performance criterion. A genetic algorithm-based selection approach for feature production attributes is proposed. Its prediction accuracy is verified via a practical wafer production line.
  • Keywords
    genetic algorithms; integrated circuit manufacture; manufacturing data processing; production control; scheduling; semiconductor industry; semiconductor technology; attribute analysis; attribute selection algorithm; data-based scheduling strategy; genetic algorithm-based selection approach; information-based manufacturing environment; input references; manufacturing scheduling; optimal production control; practical wafer production line; production control; production data processing; production management; rational attribute selection; semiconductor manufacturing; Biological cells; Genetic algorithms; Job shop scheduling; Manufacturing; Semiconductor device modeling; Training;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Automation Science and Engineering (CASE), 2013 IEEE International Conference on
  • Conference_Location
    Madison, WI
  • ISSN
    2161-8070
  • Type

    conf

  • DOI
    10.1109/CoASE.2013.6654027
  • Filename
    6654027