Title :
14.3 15fJ/b static physically unclonable functions for secure chip identification with <2% native bit instability and 140× Inter/Intra PUF hamming distance separation in 65nm
Author :
Alvarez, Anastacia ; Wenfeng Zhao ; Alioto, Massimo
Author_Institution :
Nat. Univ. of Singapore, Singapore, Singapore
Abstract :
Physically unclonable functions (PUFs) enable information security down to the chip level [1-4]. Arrays of PUF bitcells (Fig. 14.3.1) generate chip-specific keys that are unpredictable, repeatable and cannot be measured externally, thus uniquely identifying the die to counteract chip piracy/counterfeiting and enable lightweight authentication/encryption [1-4]. In silicon PUFs, trustworthy bit generation is achieved by accentuating local process variations through various circuit principles (e.g., delay mismatch) and rejecting global process/voltage/temperature (PVT) variations, layout-dependent process variations and noise [2].
Keywords :
authorisation; integrated circuit design; trusted computing; PUF bitcells; chip counterfeiting; chip level; chip piracy; chip-specific keys; circuit principles; delay mismatch; encryption; global PVT variations; global process-voltage-temperature variations; information security; layout-dependent process variations; lightweight authentication; local process variations; physically unclonable functions; size 65 nm; trustworthy bit generation; Hamming distance; Impedance; Mirrors; Noise; Robustness; Transistors;
Conference_Titel :
Solid- State Circuits Conference - (ISSCC), 2015 IEEE International
Conference_Location :
San Francisco, CA
Print_ISBN :
978-1-4799-6223-5
DOI :
10.1109/ISSCC.2015.7063023