• DocumentCode
    2063582
  • Title

    14.3 15fJ/b static physically unclonable functions for secure chip identification with <2% native bit instability and 140× Inter/Intra PUF hamming distance separation in 65nm

  • Author

    Alvarez, Anastacia ; Wenfeng Zhao ; Alioto, Massimo

  • Author_Institution
    Nat. Univ. of Singapore, Singapore, Singapore
  • fYear
    2015
  • fDate
    22-26 Feb. 2015
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    Physically unclonable functions (PUFs) enable information security down to the chip level [1-4]. Arrays of PUF bitcells (Fig. 14.3.1) generate chip-specific keys that are unpredictable, repeatable and cannot be measured externally, thus uniquely identifying the die to counteract chip piracy/counterfeiting and enable lightweight authentication/encryption [1-4]. In silicon PUFs, trustworthy bit generation is achieved by accentuating local process variations through various circuit principles (e.g., delay mismatch) and rejecting global process/voltage/temperature (PVT) variations, layout-dependent process variations and noise [2].
  • Keywords
    authorisation; integrated circuit design; trusted computing; PUF bitcells; chip counterfeiting; chip level; chip piracy; chip-specific keys; circuit principles; delay mismatch; encryption; global PVT variations; global process-voltage-temperature variations; information security; layout-dependent process variations; lightweight authentication; local process variations; physically unclonable functions; size 65 nm; trustworthy bit generation; Hamming distance; Impedance; Mirrors; Noise; Robustness; Transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid- State Circuits Conference - (ISSCC), 2015 IEEE International
  • Conference_Location
    San Francisco, CA
  • Print_ISBN
    978-1-4799-6223-5
  • Type

    conf

  • DOI
    10.1109/ISSCC.2015.7063023
  • Filename
    7063023