DocumentCode
2063582
Title
14.3 15fJ/b static physically unclonable functions for secure chip identification with <2% native bit instability and 140× Inter/Intra PUF hamming distance separation in 65nm
Author
Alvarez, Anastacia ; Wenfeng Zhao ; Alioto, Massimo
Author_Institution
Nat. Univ. of Singapore, Singapore, Singapore
fYear
2015
fDate
22-26 Feb. 2015
Firstpage
1
Lastpage
3
Abstract
Physically unclonable functions (PUFs) enable information security down to the chip level [1-4]. Arrays of PUF bitcells (Fig. 14.3.1) generate chip-specific keys that are unpredictable, repeatable and cannot be measured externally, thus uniquely identifying the die to counteract chip piracy/counterfeiting and enable lightweight authentication/encryption [1-4]. In silicon PUFs, trustworthy bit generation is achieved by accentuating local process variations through various circuit principles (e.g., delay mismatch) and rejecting global process/voltage/temperature (PVT) variations, layout-dependent process variations and noise [2].
Keywords
authorisation; integrated circuit design; trusted computing; PUF bitcells; chip counterfeiting; chip level; chip piracy; chip-specific keys; circuit principles; delay mismatch; encryption; global PVT variations; global process-voltage-temperature variations; information security; layout-dependent process variations; lightweight authentication; local process variations; physically unclonable functions; size 65 nm; trustworthy bit generation; Hamming distance; Impedance; Mirrors; Noise; Robustness; Transistors;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid- State Circuits Conference - (ISSCC), 2015 IEEE International
Conference_Location
San Francisco, CA
Print_ISBN
978-1-4799-6223-5
Type
conf
DOI
10.1109/ISSCC.2015.7063023
Filename
7063023
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