DocumentCode :
2063743
Title :
14.9 Sub-sampling all-digital fractional-N frequency synthesizer with −111dBc/Hz in-band phase noise and an FOM of −242dB
Author :
Zuow-Zun Chen ; Yen-Hsiang Wang ; Jaewook Shin ; Yan Zhao ; Mirhaj, Seyed Arash ; Yen-Cheng Kuan ; Huan-Neng Chen ; Chewn-Pu Jou ; Ming-Hsien Tsai ; Fu-Lung Hsueh ; Chang, Mau-Chung Frank
Author_Institution :
Univ. of California, Los Angeles, Los Angeles, CA, USA
fYear :
2015
fDate :
22-26 Feb. 2015
Firstpage :
1
Lastpage :
3
Abstract :
The noise performance of an all-digital phase-locked loop (ADPLL) is limited by the resolution of the time-to-digital converter (TDC). Most TDC research in the past focused on the arrival time difference between the edges of the divider feedback and the reference signal [1-2]. This results in coarser TDC resolution and worse ADPLL noise performance. This paper presents a fractional-/VADPLL that employs a new time-to-digital conversion technique based on sub-sampling phase detection. It is accomplished by directly sampling the analog voltage signal at the PLL´s high frequency node and converting it into a digital code. This achieves a higher time resolution with less power.
Keywords :
frequency synthesizers; phase detectors; phase locked loops; time-digital conversion; all-digital phase-locked loop; analog voltage signal; divider feedback; in-band phase noise; reference signal; subsampling all-digital fractional-N frequency synthesizer; subsampling phase detection; time-to-digital conversion technique; time-to-digital converter; Calibration; Frequency synthesizers; Jitter; Phase locked loops; Phase noise; Power demand; Signal resolution;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid- State Circuits Conference - (ISSCC), 2015 IEEE International
Conference_Location :
San Francisco, CA
Print_ISBN :
978-1-4799-6223-5
Type :
conf
DOI :
10.1109/ISSCC.2015.7063029
Filename :
7063029
Link To Document :
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