• DocumentCode
    2063765
  • Title

    Super-resolved parameterization of dispersive scattering mechanisms in the time-frequency plane

  • Author

    Trintinalia, L.C. ; Hao Ling

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Texas Univ., Austin, TX, USA
  • Volume
    1
  • fYear
    1995
  • fDate
    18-23 June 1995
  • Firstpage
    320
  • Abstract
    We implement a super-resolution algorithm that allows the full parameterization of waveguide-type dispersion mechanisms. In our algorithm, ESPRIT is used as the processing engine. Since super-resolution methods in their original form are not equipped to handle dispersive behavior, additional processing is required to parameterize the data. We use ESPRIT both in the time and frequency domain to extract the cutoff frequencies and the delays associated with each mode. A nonlinear sampling scheme is then used to come up with an improved estimate of the cutoff frequencies. Finally, a polynomial fit for the amplitude of each mode is performed to fully parameterize the data. The resulting curves can be displayed in the time-frequency plane with very high resolution.
  • Keywords
    delays; dispersion (wave); electromagnetic wave propagation; electromagnetic wave scattering; polynomials; signal resolution; signal sampling; time-frequency analysis; waveguide theory; EM wave propagation; ESPRIT; amplitude; cutoff frequencies; delays; dispersive scattering mechanisms; nonlinear sampling; polynomial fit; processing engine; superresolution algorithm; superresolved parameterization; time-frequency plane; waveguide-type dispersion mechanisms; Cutoff frequency; Data mining; Delay effects; Dispersion; Engines; Frequency domain analysis; Frequency estimation; Polynomials; Sampling methods; Scattering parameters;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Antennas and Propagation Society International Symposium, 1995. AP-S. Digest
  • Conference_Location
    Newport Beach, CA, USA
  • Print_ISBN
    0-7803-2719-5
  • Type

    conf

  • DOI
    10.1109/APS.1995.530024
  • Filename
    530024