DocumentCode
2063963
Title
Problems with jitter measurement in PDH/SDH-based digital telecommunication systems
Author
Angrisani, L. ; Baccigalupi, A. ; d´Angiolo, G.
Author_Institution
Dipt. di Inf. e Sistemistica, Naples Univ., Italy
Volume
1
fYear
2000
fDate
2000
Firstpage
96
Abstract
The present paper m arises from criticisms, originated by telecommunication factories, concerning some problems experienced during production tests of digital telecommunication apparatuses. The fault finding mainly concerns test equipment as well as recommendations actually in force for generating and measuring timing jitter in telecommunication systems based on both (PDH) plesiochronous and (SDH) synchronous digital hierarchies. In the paper, the aforementioned problems are first discussed in detail and then confirmed by some experiments carried out at the laboratories of a great Italian factory To meet the request of production managers, a novel, more accurate method for measuring jitter in PDH/SDH-based systems is proposed. Thanks to a suitable digital signal-processing solution, the method no longer needs timing recovery circuitry, and shows itself insensitive to non-rectangular pulse shapes. The results obtained from the application of the method to the same data signals analyzed at the aforementioned factory finally assess its reliability and efficacy
Keywords
automatic test equipment; automatic testing; digital communication; jitter; production testing; signal processing; synchronous digital hierarchy; telecommunication equipment testing; Italian factory; PDH/SDH systems; PLL; SDH synchronous digital hierarchies; digital signal-processing; digital telecommunication systems; efficacy; jitter measurement; non-rectangular pulse; plesiochronous hierarchies; production tests; reliability; Circuit faults; Force measurement; Laboratories; Production facilities; Production systems; Synchronous digital hierarchy; Synchronous generators; Test equipment; Testing; Timing jitter;
fLanguage
English
Publisher
ieee
Conference_Titel
Instrumentation and Measurement Technology Conference, 2000. IMTC 2000. Proceedings of the 17th IEEE
Conference_Location
Baltimore, MD
ISSN
1091-5281
Print_ISBN
0-7803-5890-2
Type
conf
DOI
10.1109/IMTC.2000.846819
Filename
846819
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