ADC testing based on IEEE 1057-94 standard-some critical notes

Author

Arpaia, P. ; Serra, António Cruz ; Daponte, Pasquale ; Monteiro, Conceição Libano

Author_Institution

Dipt. di Ingegneria Elettrica, Polo delle Sci. Tecnologie, Naples Univ., Italy

Volume

1

fYear

2000

fDate

2000

Firstpage

119

Abstract

In recent years, IEEE 1057-94 Standard for specifying and testing measurement devices based on analog-to-digital converters (ADCs) earned scientific interest in several topics. In particular, investigations showed the histogram test of the Standard to be insensitive to ADC hysteresis. In this paper, an alternative procedure for determining the dynamic transfer function of an ADC with hysteresis is proposed. The procedure exploits digital signal processing to reduce the huge amount of data required by the histogram test. Numerical and experimental results of performance characterization, comparison with a state-of-the-art procedure and noise-sensitivity analysis are presented and discussed

Keywords

IEEE standards; analogue-digital conversion; integrated circuit noise; integrated circuit testing; sensitivity analysis; transfer functions; ADC testing; IEEE 1057-94 standard; digital signal processing; dynamic transfer function; histogram test; noise-sensitivity analysis; performance characterization; Analog-digital conversion; Histograms; Hysteresis; IEC standards; Measurement standards; Standardization; Telecommunication computing; Testing; Transfer functions; World Wide Web;

fLanguage

English

Publisher

ieee

Conference_Titel

Instrumentation and Measurement Technology Conference, 2000. IMTC 2000. Proceedings of the 17th IEEE

Conference_Location

Baltimore, MD

ISSN

1091-5281

Print_ISBN

0-7803-5890-2

Type

conf

DOI

10.1109/IMTC.2000.846839

Filename

846839