Title :
ADC testing based on IEEE 1057-94 standard-some critical notes
Author :
Arpaia, P. ; Serra, António Cruz ; Daponte, Pasquale ; Monteiro, Conceição Libano
Author_Institution :
Dipt. di Ingegneria Elettrica, Polo delle Sci. Tecnologie, Naples Univ., Italy
Abstract :
In recent years, IEEE 1057-94 Standard for specifying and testing measurement devices based on analog-to-digital converters (ADCs) earned scientific interest in several topics. In particular, investigations showed the histogram test of the Standard to be insensitive to ADC hysteresis. In this paper, an alternative procedure for determining the dynamic transfer function of an ADC with hysteresis is proposed. The procedure exploits digital signal processing to reduce the huge amount of data required by the histogram test. Numerical and experimental results of performance characterization, comparison with a state-of-the-art procedure and noise-sensitivity analysis are presented and discussed
Keywords :
IEEE standards; analogue-digital conversion; integrated circuit noise; integrated circuit testing; sensitivity analysis; transfer functions; ADC testing; IEEE 1057-94 standard; digital signal processing; dynamic transfer function; histogram test; noise-sensitivity analysis; performance characterization; Analog-digital conversion; Histograms; Hysteresis; IEC standards; Measurement standards; Standardization; Telecommunication computing; Testing; Transfer functions; World Wide Web;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2000. IMTC 2000. Proceedings of the 17th IEEE
Conference_Location :
Baltimore, MD
Print_ISBN :
0-7803-5890-2
DOI :
10.1109/IMTC.2000.846839
