DocumentCode :
2064173
Title :
Transient Saturation Spectroscopy for measuring the lifetime of hyperfine sublevels in 167Er3+ ions doped in a silicate glass fiber
Author :
Hashimoto, Daisuke ; Shimizu, Kaoru
Author_Institution :
NTT Basic Res. Labs., NTT Corp., Atsugi, Japan
fYear :
2011
fDate :
22-26 May 2011
Firstpage :
1
Lastpage :
1
Abstract :
We report our observation of the high population relaxation rate β of hyperfine sublevels in 167Er3+ ions doped in a silicate glass fiber (EDF). In contrast to the case with a crystalline Y2SiO5 host, we observed that the β value became two orders higher at 4 K. Furthermore, we observed the decrease in the β value with respect to the increase in the temperature from 4 K to 20 K.
Keywords :
erbium; glass fibres; hyperfine structure; ions; semiconductor doped glasses; semiconductor doping; Er; high population relaxation rate; hyperfine sublevels; ions; silicate glass fiber; transient saturation spectroscopy; Optical polarization; Transient analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Lasers and Electro-Optics Europe (CLEO EUROPE/EQEC), 2011 Conference on and 12th European Quantum Electronics Conference
Conference_Location :
Munich
ISSN :
Pending
Print_ISBN :
978-1-4577-0533-5
Electronic_ISBN :
Pending
Type :
conf
DOI :
10.1109/CLEOE.2011.5942839
Filename :
5942839
Link To Document :
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