Title : 
Transient Saturation Spectroscopy for measuring the lifetime of hyperfine sublevels in 167Er3+ ions doped in a silicate glass fiber
         
        
            Author : 
Hashimoto, Daisuke ; Shimizu, Kaoru
         
        
            Author_Institution : 
NTT Basic Res. Labs., NTT Corp., Atsugi, Japan
         
        
        
        
        
        
            Abstract : 
We report our observation of the high population relaxation rate β of hyperfine sublevels in 167Er3+ ions doped in a silicate glass fiber (EDF). In contrast to the case with a crystalline Y2SiO5 host, we observed that the β value became two orders higher at 4 K. Furthermore, we observed the decrease in the β value with respect to the increase in the temperature from 4 K to 20 K.
         
        
            Keywords : 
erbium; glass fibres; hyperfine structure; ions; semiconductor doped glasses; semiconductor doping; Er; high population relaxation rate; hyperfine sublevels; ions; silicate glass fiber; transient saturation spectroscopy; Optical polarization; Transient analysis;
         
        
        
        
            Conference_Titel : 
Lasers and Electro-Optics Europe (CLEO EUROPE/EQEC), 2011 Conference on and 12th European Quantum Electronics Conference
         
        
            Conference_Location : 
Munich
         
        
        
            Print_ISBN : 
978-1-4577-0533-5
         
        
            Electronic_ISBN : 
Pending
         
        
        
            DOI : 
10.1109/CLEOE.2011.5942839