DocumentCode
2064247
Title
A high-resolution TDC implemented in a 90nm process FPGA
Author
Jinmei Lai ; Yanquan Luo ; Qi Shao ; Lichun Bao ; Xueling Liu
Author_Institution
State Key Lab. of ASIC & Syst., Fudan Univ., Shanghai, China
fYear
2013
fDate
28-31 Oct. 2013
Firstpage
1
Lastpage
3
Abstract
This paper represents a Time-to-digital Converter (TDC) architecture based in a FPGA. The proposed architecture relies on a single tapped-delay line to implement time-to-digital conversion, taking advantage of the fast dedicated carry chains available within FPGAs. The results of post-route simulation indicate that this architecture offered a time resolution of 34ps with a 12 ps precision. In a Virtex-4 FPGA that is fabricated in the 90nm process this structure achieved a resolution of 48ps and a precision of 35ps.Commonly, to design a TDC on a FPGA requires iterative manual adjustment in the placement and route of the circuit; however, in the architecture presented in this paper, we controls the performance of pivotal parts of the circuit with user constraints instead of manual adjustment, which makes this TDC architecture access to portability.
Keywords
CMOS integrated circuits; delay lines; field programmable gate arrays; time-digital conversion; TDC architecture; Virtex-4 FPGA; dedicated carry chains; iterative manual adjustment; post-route simulation; single tapped-delay line; size 90 nm; time-to-digital converter architecture; user constraints; Adders; Delays; Fabrication; Field programmable gate arrays; Manuals; Radiation detectors; FPGA; Time-to-digital Converter (TDC);
fLanguage
English
Publisher
ieee
Conference_Titel
ASIC (ASICON), 2013 IEEE 10th International Conference on
Conference_Location
Shenzhen
ISSN
2162-7541
Print_ISBN
978-1-4673-6415-7
Type
conf
DOI
10.1109/ASICON.2013.6811853
Filename
6811853
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