An adaptive path selection method for delay testing

To deal with the weakness of traditional delay test techniques, based on the path delay fault model, a new delay test approach including a new delay test output observation method and an adaptive path selection method is proposed in this work. The basic idea of the approach is to measure the signal transition time for each delay test, and more paths are selected for a second stage test (if necessary) to ensure the timing behavior of the circuit under test. Experimental results obtained by computer simulation demonstrate that a more thorough test is really a need if many significantly late signal transitions are observed