DocumentCode :
2065113
Title :
Distortion-invariant object recognition using adaptive resonance theory
Author :
Kadiran, Shajan ; Patnaik, L.M.
Author_Institution :
Tata Consultancy Services, Bombay, India
fYear :
1993
fDate :
24-26 Nov 1993
Firstpage :
341
Lastpage :
344
Abstract :
Classification and recognition of multiple objects under changes in position, orientation and scale are needed in practical applications such as automation of assembly lines. One of the main drawbacks in the conventional pattern recognition technique is the enormous time and computational overhead required for classification. However, the conventional techniques are well-suited for extracting the features of objects. Recently, the advantages of artificial neural networks (ANNs) of having a high degree of fault-tolerance have been used in the field of pattern classification problems. The authors have combined the advantages of both the traditional pattern recognition methodology and the neural network paradigm for the distortion-invariant object recognition. The first part of this work deals with the traditional pattern recognition techniques for the extraction of the features of objects. To extract the invariant features of objects, geometrical moment-invariant techniques are used. In the case of multiple objects, the authors do segmentation of each object before extracting the features. A neural network paradigm called the ART2-analog version of adaptive resonance theory is employed to classify objects from the extracted features
Keywords :
fault tolerant computing; feature extraction; image recognition; image segmentation; neural nets; ART2-analog version; adaptive resonance theory; artificial neural networks; assembly lines; computational overhead; distortion-invariant object recognition; fault-tolerance; feature extraction; geometrical moment-invariant techniques; image segmentation; multiple object classification; multiple object recognition; neural network; pattern classification; pattern recognition; pattern recognition methodology; position change; time; Artificial neural networks; Assembly; Automation; Fault tolerance; Feature extraction; Neural networks; Object recognition; Pattern classification; Pattern recognition; Resonance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Artificial Neural Networks and Expert Systems, 1993. Proceedings., First New Zealand International Two-Stream Conference on
Conference_Location :
Dunedin
Print_ISBN :
0-8186-4260-2
Type :
conf
DOI :
10.1109/ANNES.1993.323007
Filename :
323007
Link To Document :
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