Title :
Contrast sensitivity and dynamic range measurements of CdZnTe semiconductors for direct type flat-panel imaging
Author :
Giakos, G.C. ; Guntupalli, R. ; Shah, N. ; Vedantham, S. ; Suryanarayanan, S. ; Chowdhury, S. ; Passerini, A.G. ; Mehta, K. ; Sumrain, S. ; Patnekar, N. ; Evans, E.A. ; Endorf, R. ; Russo, Fabrizio
Author_Institution :
Dept. of Biomed. Eng., Akron Univ., OH, USA
Abstract :
The contrast sensitivity and dynamic range of Cd1-xZn xTe semiconductor detectors have been measured within the X-ray diagnostic energy range, using a contrast sensitivity phantom. The aim of this study is to optimize the image quality parameters of these solid state-ionization devices for flat panel digital radiographic applications. The experimental results of this study indicate that Cd 1-xZnxTe detectors have excellent contrast sensitivity response and large dynamic range
Keywords :
II-VI semiconductors; X-ray detection; biomedical equipment; cadmium compounds; diagnostic radiography; image sensors; semiconductor counters; zinc compounds; CdZnTe; X-ray diagnostic energy range; contrast sensitivity; direct type flat-panel imaging; dynamic range; flat panel digital radiography; image quality parameters; phantom studies; semiconductor detectors; solid state-ionization devices; Dynamic range; Energy measurement; Image quality; Imaging phantoms; Solids; Tellurium; X-ray detection; X-ray detectors; X-ray imaging; Zinc;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2000. IMTC 2000. Proceedings of the 17th IEEE
Conference_Location :
Baltimore, MD
Print_ISBN :
0-7803-5890-2
DOI :
10.1109/IMTC.2000.846889
