DocumentCode
2065774
Title
A high gain, wide bandwidth isolated amplifier for using in fracture process transient analysis
Author
Perez, M.A. ; Romero, V. ; Anton, Juan C. ; Campo, J.C.
Author_Institution
Area de Tecnologia Electron., Oviedo Univ., Spain
Volume
1
fYear
2000
fDate
2000
Firstpage
437
Abstract
In this paper an instrumentation system for measuring the fracture mechanism in impact test of materials is presented. This kind of system could extend the applicability of impact tester to obtain additional information about the transient process that take place during the short rime of the fracture evolution
Keywords
automatic test equipment; fracture mechanics; impact testing; operational amplifiers; signal processing equipment; strain gauges; transient analysers; fracture process analysis; impact tester; strain sensor; transient analysis; wide bandwidth isolated amplifier; Bandwidth; Bridge circuits; Capacitive sensors; Instruments; Materials testing; Strain measurement; Stress; System testing; Transient analysis; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Instrumentation and Measurement Technology Conference, 2000. IMTC 2000. Proceedings of the 17th IEEE
Conference_Location
Baltimore, MD
ISSN
1091-5281
Print_ISBN
0-7803-5890-2
Type
conf
DOI
10.1109/IMTC.2000.846901
Filename
846901
Link To Document