• DocumentCode
    2065905
  • Title

    A new method for conducted EMI measurements on three phase systems

  • Author

    De Bonitatibus, Antonio ; De Capua, Claudio ; Landi, Carmine

  • Author_Institution
    Ist. Teoria e Tecnica delle Onde Elettromagnetiche, Ist. Univ. Navale, Naples, Italy
  • Volume
    1
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    461
  • Abstract
    The paper describes a new three phase measurement technique for conducted electromagnetic interference (EMI) measurements with respect to the measurement procedure prescribed from the (CISPR 16) Standard Rules. This technique allows measurement of the common mode and differential mode components of voltage and current. The measurement set-up is composed of appropriately selected voltage and current probes and hybrid junctions. Although this technique has been conceived to best monitor the behavior of the conducted interference it can be also adapted in order to design an alternative and improved measurement set-up for the (CISPR 16) Standard Rules. A complete theoretical and experimental study, performed on a three phase switched-mode power supply, is accomplished showing the suitability of this new measurement technique
  • Keywords
    electric current measurement; electromagnetic interference; power supply quality; switched mode power supplies; variable speed drives; voltage measurement; CISPR 16 Standard Rules; common mode components; conducted EMI measurements; current probes; differential mode components; hybrid junctions; impedance matching; measurement set-up; power splitter; switched-mode power supply; three phase systems; twisted-pair transmission lines; voltage probes; Current measurement; Electromagnetic interference; Electromagnetic measurements; Hybrid junctions; Measurement standards; Monitoring; Performance evaluation; Phase measurement; Probes; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference, 2000. IMTC 2000. Proceedings of the 17th IEEE
  • Conference_Location
    Baltimore, MD
  • ISSN
    1091-5281
  • Print_ISBN
    0-7803-5890-2
  • Type

    conf

  • DOI
    10.1109/IMTC.2000.846906
  • Filename
    846906