Title :
25.4 A 1/f noise upconversion reduction technique applied to Class-D and Class-F oscillators
Author :
Shahmohammadi, Mina ; Babaie, Masoud ; Staszewski, Robert Bogdan
Author_Institution :
Delft Univ. of Technol., Delft, Netherlands
Abstract :
The 1/f (flicker) noise upconversion degrades the close-in spectrum of CMOS RF oscillators. The resulting 1/f3 phase noise (PN) can be an issue in PLLs with a loop bandwidth of <;1MHz, which practically implies all cellular phones. A previously published noise-filtering technique [1] and adding resistors in series with gm-device drains [2] have shown significant reduction of the 1/f3 oscillator PN corner. However, the former needs an additional tunable inductor and the latter degrades PN in the 20dB/dec region.
Keywords :
1/f noise; CMOS integrated circuits; flicker noise; phase noise; radiofrequency oscillators; 1-f noise upconversion reduction technique; CMOS RF oscillators; Class-D oscillators; Class-F oscillators; PLL; close-in spectrum; flicker; gm-device drains; noise-filtering technique; phase noise; resistors; tunable inductor; 1f noise; CMOS integrated circuits; Capacitors; Harmonic analysis; Inductors; Oscillators; Resonant frequency;
Conference_Titel :
Solid- State Circuits Conference - (ISSCC), 2015 IEEE International
Conference_Location :
San Francisco, CA
Print_ISBN :
978-1-4799-6223-5
DOI :
10.1109/ISSCC.2015.7063117