Title :
Transient response and dynamic characterization of a new active filter algorithm based on self-tuned vector filter
Author :
Perales, M.A. ; Mora, J.L. ; Terrón, L. ; Carrasco, J.M. ; Franquelo, L.G.
Author_Institution :
Departamento de Ingenieria Electronica, Sevilla Univ., Seville, Spain
Abstract :
A new method for calculating the reference of an active filter was presented by the authors in previous papers. This method has demonstrated very good performance on distorted and unbalanced conditions, although no transient analysis had been made. In this paper, the method is analyzed in transient conditions, showing very good response in load changes and frequency perturbations. The influence of variation of the filter constant, kf is studied, by means of simulation and experimentation, in order to determine the influence of this parameter. For this purposes a performance index is defined and measured in different conditions to deduce the dependence of the transient response with respect to the constant kf. Extensive simulations and experimentations have been made showing a very interesting, and somehow unpredicted result. Also, the ability of adapting the fundamental frequency is tested, and studied its dependence with kf and with the constant KI associated to the frequency control loop. This was another property enounced in previous works but never tested before, and the results are really good, both in simulation and experimental cases, confirming that is a self-tuned filter. Some design criteria are exposed in order to facilitate the implementation of an active power filter based on this kind of structure.
Keywords :
active filters; harmonic distortion; performance index; power harmonic filters; power supply quality; transient response; active filter algorithm; dynamic characterization; frequency perturbations; load changes; performance index; self-tuned vector filter; transient analysis; transient response characterization; Active filters; Equations; Frequency estimation; IEEE members; Performance analysis; Pollution measurement; Testing; Transient analysis; Transient response; Voltage;
Conference_Titel :
Power Electronics Specialists Conference, 2002. pesc 02. 2002 IEEE 33rd Annual
Print_ISBN :
0-7803-7262-X
DOI :
10.1109/PSEC.2002.1023898