DocumentCode
2066242
Title
The timing control design of 65nm block RAM in FPGA
Author
Xinrui Zhang ; Jian Wang ; Dan Chen ; Jinmei Lai ; Lichun Bao ; Xueling Liu
Author_Institution
State Key Lab. of ASIC & Syst., Fudan Univ., Shanghai, China
fYear
2013
fDate
28-31 Oct. 2013
Firstpage
1
Lastpage
4
Abstract
The timing control design of 65 nm-based FPGA embedded Block RAM is presented. The strategy involves both the internal timing control system with test reliability considered and the status flag timing control of BRAM-based FIFO. With redundant circuits using dynamic feedback ideology, introducing an optional delay chain optimization and optimizing clock latency strategies, the strategy guarantees the reliability of timing control in BRAM. Meanwhile, optimizing speed makes the proposed design practical. The proposed BRAM can work in a variety of work environments correctly and maximize success rate of tapeout. It is 41.5%~59.2% deceasing in control delay than that in the structure of Ref [7]. BRAM with novel timing control design is designed with the speed of 400 MHz, which is 25% faster than that in Ref [9].
Keywords
circuit reliability; field programmable gate arrays; random-access storage; timing; BRAM-based FIFO; FPGA embedded block RAM; dynamic feedback ideology; frequency 400 MHz; internal timing control system; optimizing clock latency strategies; optional delay chain optimization; redundant circuits; size 65 nm; status flag timing control; test reliability; timing control design; Delays; Field programmable gate arrays; Integrated circuit reliability; Random access memory; Reliability engineering; Block RAM; FIFO; FPGA; Timing Control;
fLanguage
English
Publisher
ieee
Conference_Titel
ASIC (ASICON), 2013 IEEE 10th International Conference on
Conference_Location
Shenzhen
ISSN
2162-7541
Print_ISBN
978-1-4673-6415-7
Type
conf
DOI
10.1109/ASICON.2013.6811932
Filename
6811932
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