Title :
The timing control design of 65nm block RAM in FPGA
Author :
Xinrui Zhang ; Jian Wang ; Dan Chen ; Jinmei Lai ; Lichun Bao ; Xueling Liu
Author_Institution :
State Key Lab. of ASIC & Syst., Fudan Univ., Shanghai, China
Abstract :
The timing control design of 65 nm-based FPGA embedded Block RAM is presented. The strategy involves both the internal timing control system with test reliability considered and the status flag timing control of BRAM-based FIFO. With redundant circuits using dynamic feedback ideology, introducing an optional delay chain optimization and optimizing clock latency strategies, the strategy guarantees the reliability of timing control in BRAM. Meanwhile, optimizing speed makes the proposed design practical. The proposed BRAM can work in a variety of work environments correctly and maximize success rate of tapeout. It is 41.5%~59.2% deceasing in control delay than that in the structure of Ref [7]. BRAM with novel timing control design is designed with the speed of 400 MHz, which is 25% faster than that in Ref [9].
Keywords :
circuit reliability; field programmable gate arrays; random-access storage; timing; BRAM-based FIFO; FPGA embedded block RAM; dynamic feedback ideology; frequency 400 MHz; internal timing control system; optimizing clock latency strategies; optional delay chain optimization; redundant circuits; size 65 nm; status flag timing control; test reliability; timing control design; Delays; Field programmable gate arrays; Integrated circuit reliability; Random access memory; Reliability engineering; Block RAM; FIFO; FPGA; Timing Control;
Conference_Titel :
ASIC (ASICON), 2013 IEEE 10th International Conference on
Conference_Location :
Shenzhen
Print_ISBN :
978-1-4673-6415-7
DOI :
10.1109/ASICON.2013.6811932